カプラー／製造ライン用製品MP300MX1
3つのコンタクトデバイスの
同時パーソナライズが可能
MP3000 MX1は、高性能パーソナライゼーションカプラを探しているすべてのスマートカードメーカーおよびスマートオブジェクトメーカーに対するマイクロプロスからの答えです。
MP300 MX1の主な機能
- Personalisation of 3 contact devices simultaneously
- All 3 devices are handled in a fully independant manner
- Support of SWP, USB and SD protocols is optionnal
- Fully compatible with ETSI TS 102 613 and ETSI TS 102 622 specification
- Continuity test feature, for a first level of quality inspection
- Open API : possibility to implement custom protocols
- Physical parameters flexibility : possibility to program the Vcc and the Clock values
- Can be combined on the same MP300 mother board with another MP300 MX1 (6 simultaneous heads) or with a MP300MCL1 for 3 dual interface couplers
対応プロトコル
ISO/IEC 7816-3
- T=0 and T=1 protocols : 100% implemented, managed by Firmware and FPGA, accelerated by hardware
SWP/HCI (ETSI TS 102.613 and ETSI TS 102.622) (optionnal)
- SWP transmission : Assisted by hardware
- LLC layers support : ACT, CLT, S-HDLC realised by firmware
USB 2.0 (optionnal)
- Available speeds : Low speed, full speed
- Classes : ISO/IEC 7816-12, mass storage, custom protocols
Synchronous chips
- Support of all kind of memory components (SLE 46xx, T2G, …)
SD/MMC 4.1 (optionnal)
- Data bus : 1 and 4 bits
- Low level commands : Available
Raw mode
- Implementation of custom protocols and support of out of standard chips
プログラム可能なパラメータ
Physical parameters
- Voltages
- Vcc : Adjustable from 0V to 6V
- Vol/Voh : 0V / 1.55V to 5.8V
- Clock frequency
- ISO 7816 clock :
- Adjustable from 10kHz to 50Mhz
- Duty cycle : 50%
- Pin states
- All pins can be managed separately
ISO 7816 communication parameters
- Adjustable parameters : All normative timings (WWT, BWT, CWT, …), parity, pull-up resistor
SWP communication parameters
- Available baudrates : 212 kbps
- Adjustable parameters : Activation time, P2, P3 parameters
USB-IC parameters
- Voltage classes supported : 1.8V and 3.0V
利用可能な試験
Continuity test
- Inspects the overall connection from the output of the coupler to the smart card connection.
- Simular to Open/short test
